Revolutionizing Device Testing: Advantest’s M4841 Handler with Active Thermal Control for Enhanced Throughput and Faster Test Times
Advantest Expands M4841 Handler with Active Thermal Control for Faster Device Throughput and Test Introduction Advantest Corporation, a leading semiconductor test equipment supplier, recently introduced a new Active Thermal Control (ATC) option for its M4841 high-volume device handler. This innovation enables dynamic multisite sensing and regulation of device temperature, optimizing the test process for high-end…