Maximizing Profitability: Advantest Introduces E5620 DR-SEM for Precise Review and Classification of Ultra-Small Photomask Defects
Advantest Unveils E5620 DR-SEM for Review and Classification of Ultra-Small Photomasks Overview Advantest Corporation has introduced its latest cutting-edge technology, the E5620 Defect Review Scanning Electron Microscope (DR-SEM). This innovative mask SEM product is designed to review and classify ultra-small defects on photomasks and mask blanks with high precision and efficiency. Features The E5620 DR-SEM…